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현미경을 이용한 샘플의 높이측정방법
Certificate of Patent | Go to Main Page |
Binocular, Zoom Microscope Body6.7:1 Zoom RatioView Inclination Angle : 45°Zoom Magnification : 0.67~4.5xWorking Distance : 110mm
Eyepiece 10X (F.N :22) Diopter Adjustment
Standard Stand For Focusing Stroke : 120mm Base Size : 290x314mm(WxD)
4 Split LED Ring Light + LED Ring Light Guide Adapter
If you are interested in stock we have, please feel free to contact us.
E-mail : jhjin@jnoptic.com / Tel : 82-2-3473-4188
U-HSTR2
STM6 X-Y data cable
26OCM10/100
30.5S-G533
A 40 PL
AA1276
ADOBE PHOTOSHOP ELEMENTS 2.0
AL-1824
U-TV0.5X (SOLD OUT)
DP70-IFAD
FLM6
FV5-COL
FV5-FUR
IX-DP10
IX-DP40
IX-DPA20
IX2-ARCEVA
IX2-DIC10
IX2-DIC40
IX2-DIC60
IX2-RFAL
IX2-SHA-1-5
IX-SCL
IX-SUSP
LG-DI
LN22-P-13N1B
MM6-RHS250-2 (SOLD OUT)
PCDA40XPL-6
PL20
QUICKCAM FAST
RX-XYST
SZ2-LGSI
SZH-CLJ
SZX-APT
SZX-AS
SZX-STAD1
SZX-STL
U-ACAD4515-1-5
U-APT (Without Power cord)
U-DO3 (SOLD OUT)
U-HSTR2 (SOLD OUT)
U-OSM
WI-FSH
XL-CAP
PLAPO60XWLSM
LMPLFL100X
LCPLAPO50X
(교육내용 구성)
현미경의 구조 이해
대물렌즈의 적합성 및 스펙 확인
현미경의 기본 관찰법 (BF, DF, Phase, DIC… )
…
Lecture Materials for Microscopy
Profile of JIN Jae-Hwan ( Instructor )
CEO of JNOpTIC co., ltd
1999년 10월4일
(주)택산상역 입사
2000년 06월05일 ~ 06월15일 ( OLYMPUS Japan in Tokyo)
Basic Knowledge of Microscope and Repair Training Course
2001년12월04일 ( OLYMPUS Japan in Tokyo)
Measuring Microscope Calibration License
Main Model: STM6
License ID Number: M029
2003년09월04일 ( OLYMPUS Japan in Tokyo)
Biological Confocal Microscope Setup & Service Training
Main Model: FluoView300 & FluoView500
2003년10월03일 ( OLYMPUS Japan in Tokyo)
Inverted Microscope & Research Stereo Microscope Service Training
Main Model: IX71 / SZX9
2004년08월17일 ~ 8월20일 ( OLYMPUS Japan in Tokyo)
Confocal Microscope Setup & Service Training
Main Model: FV1000
2004년 10월11 ~ 10월13일 ( OLYMPUS Japan in Tokyo)
Confocal Microscope Setup & Service Training
Main Model: FV1000 M-COMB(Multi Combiner)
2005년06월20일 ~ 06월23일 ( OLYMPUS Japan in Tokyo)
Research System Microscope Service Training
Main Model: AX70
2005년08월01일~08월02일 ( OLYMPUS Japan in Tokyo)
Polarizing Microscope Instruction Training
Main Model: BX51P
2005년12월19일 ~ 19일 ( OLYMPUS Japan in Tokyo)
ZDC Training for Maintenance & Basic Knowledge of Confocal Microscope
2005년12월20일 ~ 22일 ( OLYMPUS Japan in Tokyo)
현미경의 성능을 끌어내는 Brushup Course (GA Academy)
2006년08월02일 ~ 08월04일 ( OLYMPUS Japan in Tokyo)
Confocal Laser Scanning Microscope for Industrial Market
D class License(for ols3000)
Main Model: OLS 3000(Lext)
2006년10월11일 ~ 10월15일 ( OLYMPUS Japan in Tokyo)
Confocal Laser Scanning Microscope Training for Bio Maket
Maintenance Service Training
Main Mode : M-COMB(Multi Combiner for FV1000)
2006년12월09일 IX Repair 교육
2007년05월07일 ~ 05월11일 ( OLYMPUS Japan in Tokyo)
Modify Training for Zero-Drift Compensation Unit of IX81
IX2-Cusominsing Training (Optic Port Modify)
Main Model: IX71 & IX81-ZDC
2007년09월03일 ~ 09월08일 ( OLYMPUS Japan in Tokyo)
Leicense D class Trainging
Main Model: OLYMPUS Bio Confocal Microscope FV1000
2008년04월08일 ~ 04월10일 ( OLYMPUS Japan in INA_Nagano )
IV100 Setup Training
(in vivo fluorescence molecular imaging systems)
2008년07월22일 ~ 07월23일 ( Narishige Group in Tokyo, Japan )
Narishige Maintenance Training
2008년07월24일 ~ 07월28일 ( OLYMPUS Japan in Tokyo)
Research Inverted Microscope maintenance Training
Main Model: IX81
2009년05월18일 ~ 5월22일 ( OLYMPUS Japan in Tokyo)
OLYMPUS Bio Confocal Microscope License Training
License Grade: FV1000 C class
2009년06월23일 ~ 06월26일 ( OLYMPUS Japan in Tokyo)
Confocal Laser Scanning Microscope License Training
License Grade: FV10i C class
2009년 10월19일 ~ 10월23일 ( OLYMPUS Japan in Tokyo )
Multi Photon Laser Scanning MICROSCOPE Setup Training
Main Model: MPE C class
2010년08월03일 ~ 08월08일 ( OLYMPUS Japan in Tokyo )
Modify Training for Zero-Drift Compensation Unit of IX81
Main Model: IX81-ZDC2
2011년 04월18일
Start a Business – JNOpTIC co., LTD
2013년 04월4일
특허 출원: 현미경을 이용한 샘플의 높이 측정 방법
2014년 06월12일
특허 등록: 현미경을 이용한 샘플의 높이 측정 방법
JNO-DPTS (Down load Catalog JNO-DPTS)
The Unit to observe fluorescence image and IR DIC image at the same time with Multi-Dual Port tube of BX51-WI
(Made by JNOpTIC co.,ltd )
2-1. One Way((IR-DIC 775nm)
2-2. One Way((Visible Spectrum)
Simultaneously observation
– CA3 pyramidal neuron, IR-DIC & Alexa Fluor 488 (50 uM)
Advance Realtime Monitor. Easy-to-Use, Image Enhancement, etc
ARM is image analysis software for JNOPTIC AcquCAM cameras. This S/W is interchangeable with all WDM cameras regardless of camera brand and model and even more the most strength point is simple and easy use of length, area, angle, etc.
Improvement Function about Microscopy Image Monochrome. (Used function: Auto Level)Effective improvement of image with simple operation. This image is shot by JNOPTIC Pro/S3 camera
Improvement Function about Microscopy Image. (Used function: Auto Level)Effective improvement of image with simple operation. These images are shot by JNOPTIC AcquCAM Pro/G3 camera
Responding Model | Measurement value unit | Measurable height | Error of measuring 1000㎛ | Recommended measuring height |
CX 41 | 0.2 ㎛ | -9.9 ~ 29.9㎜ | Below ±20㎛ | Below ± 2000㎛ |
CKX 41 | 0.2 ㎛ | -9.9 ~ 29.9㎜ | Below ±20㎛ | Below ± 2000㎛ |
BX – FM | 0.2 ㎛ | -9.9 ~ 29.9㎜ | Below ±20㎛ | Below ± 2000㎛ |
BX 51/53 | 0.1 ㎛ | -9.9 ~ 29.9㎜ | Below ±10㎛ | Below ± 1000㎛ |
MX 51 | 0.1 ㎛ | -9.9 ~ 29.9㎜ | Below ±10㎛ | Below ± 1000㎛ |
MX 61L/61 | 0.1 ㎛ | -9.9 ~ 29.9㎜ | Below ±10㎛ | Below ± 1000㎛ |
JNOPTIC Image Analysis Software OpTIC Eye Series
기본측정+오토카운팅(입도분석용)+금속조직분석용
– 형상측정(상분율측정)
: 두가지 이상의 색상을 추출하여 면적율 계산
– 그레인사이즈(Grain Size Analysis)
: ASTM E 1382에 의한 금속표면의 결정립도 산출
: 교차점 / 면적 / 수동면적 추출방식
– 구상화율 분석(Nodular-graphite analysis)
: ASTM, ISO, JIS 규격에 따라 분석이 가능
– 비금속 개재물(Non-Metallic Inclusion)
: 산화물, 규산물, 황화물, 내화물, 광재등 추출
영상분석에 의한 구상화율 측정 (nodular-graphite analysis)
주철분석 소프트웨어 모듈로 ASTM, JIS, KS 규격에 따라 구상흑연주철의 구상흑연에 대하여 현미경영상분석을 통해 구상화율을 측정하고 결과를 표시합니다.
영상분석에 의한 결정도립 측정 (rain Size Analysis)